Grain sizes dramatically influence observed 2D XRD images, with fine grains appearing as rings and coarse grains as spots. In the classical approach, XRD software only attempted crystal phase identification after converting the 2D diffraction image to a 1D profile. Information about grain conditions in the 2D diffraction image was not used. The Powder XRD plugin for SmartLab Studio II uses both the 2D diffraction image and a 1D profile derived from it for analysis. Using information about crystal grains obtained from 2D diffraction images for search/match, phase identification can be done easily.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Windows®-based software suite for Rigaku's X-ray diffractometers
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers