To capture the moment when materials change, such as during melting, solidification or crystal phase change, by in-situ X-ray diffraction measurement, the acquisition time of the X-ray diffraction images at each temperature needs to be as short as possible. 0D and 1D detectors take time to scan the detector and prepare for operation. Conventional 2D detectors also have a problem in that the X-ray shutter needs to be opened and closed between counting and reading the data. The HyPix-3000 hybrid pixel array multi-dimensional detector in 2D mode can acquire X-ray diffraction images without scanning the detector. The HyPix-3000 has two counters inside. Switching between them allows measurement without dead time. These features enable shutterless measurement of 2D X-ray diffraction images, which makes it possible to observe rapid changes in crystalline state.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
Windows®-based software suite for Rigaku's X-ray diffractometers