To investigate the crystal structure of a material sensitive to changes in environment, it is necessary to obtain diffraction data rapidly and accurately under a precisely controlled measurement environment. By combining a two-dimensional (2D) detector with attachments that precisely control ambient conditions such as temperature, humidity, and inert gas, even fast structural changes are revealed in the 2D diffraction patterns. Massive 2D data obtained during the in-situ measurement can easily be converted to 2θ-intensity (I) data by the Data Visualization (DV) plugin of SmartLab Studio II. In addition, the DV plugin includes useful functions that batch-process all structural parameters, such as peak position, d-value, crystallite size, etc., and plot all of them on one graph. Here, this outstanding feature of the DV plugin is demonstrated through the data pro- cessing of a large number of 2D images of vegetable based cream (VBC) obtained by DSC and HyPix-3000.
XRD products from Rigaku
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers