In quantitative analysis by the X-ray diffraction method, it is necessary to accurately determine the integrated intensities of peaks corresponding to each component. However, it is difficult to calculate integrated intensities for a compound having low crystallinity and, therefore, broad peaks. Our new quantitative analysis method, the Direct Derivation (DD) method, performs Whole Powder Pattern Fitting (WPPF) based on the measured profiles of a single component. As a result, WPPF can be easily performed even on compounds that show complex patterns that conventionally make it difficult to calculate the profile function from the crystal structure. Here, mixtures of α-Al₂O₃ and γ-Al₂O₃ were quantified.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Windows®-based software suite for Rigaku's X-ray diffractometers
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers