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Phase identification and orientation analysis for thin film SOFC material using a 2D detector

AppNote XRD2020: Phase identification and orientation analysis for thin film SOFC material using a 2D detector

 

Thin films formed on substrates show various crystal phase and orientations depending on the materials and manufacturing method. Therefore, phase identification is sometimes difficult by ordinary X-ray diffraction measurement. The diffraction image using a two-dimensional detector reveals the lattice constant and the orientation for each crystal phase readily because the diffraction intensity distribution in the 2θ direction and the distribution of the crystal orientation in the χ direction are observed simultaneously.

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