Thin films formed on substrates show various crystal phase and orientations depending on the materials and manufacturing method. Therefore, phase identification is sometimes difficult by ordinary X-ray diffraction measurement. The diffraction image using a two-dimensional detector reveals the lattice constant and the orientation for each crystal phase readily because the diffraction intensity distribution in the 2θ direction and the distribution of the crystal orientation in the χ direction are observed simultaneously.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
Windows®-based software suite for Rigaku's X-ray diffractometers