Background
The grazing-incidence wide-angle X-ray scattering (GI-WAXS) technique is often employed for the measurement of ultrathin film specimens since their very weak signals can be effectively observed. GI-WAXS can be applied to materials that cannot be evaluated by transmission WAXS, such as thin film on a substrate or a polymer film with metal deposition on the back surface. The combination of a 2D-SAXS/WAXS attachment with an aperture slit and a 2D detector allows the acquisition of clearly resolved 2D diffracted images by a general X-ray diffractometer with a line-shaped incident beam.
XRD products from Rigaku
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers