The figure below shows the results of a Rietveld refinement for a cement sample using powder diffraction data collected on an Ultima IV multipurpose diffraction system at 298 K.
X-ray diffraction analysis of cements for quality control and research and development poses a significant challenge, as there are a large number of phases associated with each type of cement. These phases result in a substantial peak overlap.
The Rietveld refinement method represents a viable technique to address these issues and obtain a reasonable quantitative result for each of the phases present.
Calculated (orange), experimental (black), and difference (pink) profiles are shown along with phases present and quantitative analysis results.