How Is Crystal Orientation Determined?
X-ray diffraction (XRD) for determining orientation
Single crystals form the basis of a wide range of technological products. Electronic properties of single crystals are critical to the semiconductor industry while magnetic properties of single crystals are important to the performance of magnetic storage devices. Mechanical and chemical properties of single crystals underlie advances in materials science. In most cases, the properties of a single crystal are not only a function of the type and quality of the crystal, but strongly dependent on its orientation. Determination of orientation thus represents an essential step for using single crystals in technological applications. X-ray diffraction (XRD) has become the universal method for determining crystal orientation.
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Learn moreApplication notes
The following application notes are relevant to this technique
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XRD2001 - Orientation and Residual Stress Evaluation in Metal Thin Films
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B-XRI1024 - Fiber orientation analysis of short fibers in GFRPs by micro X-ray CT
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B-XRD2032 - Observation of Orientation State of Polypropylene Film Products by 2D-GIWAXS Measurement
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B-XRD2028 - Off-normal Fiber Texture Analysis by Pole Figure Measurement
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B-XRD2027 - Evaluation of Uniformity of a Single Crystal Substrate by Rocking Curve Measurement
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B-XRD2025 - Analysis of Uniaxially Oriented Film by Wide-range RSM
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B-XRD2024 - High-speed RSM of a III-nitride Epitaxial Film by 1D Detection Mode
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B-XRD2023 - Phase Identification of an Organic Thin Film by GIWAXS Measurement with a 2D detector
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B-XRD2021 - High-speed RSM of an Epitaxial Film by 1D Detection Mode
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B-XRD2020 - Phase ID and Orientation Analysis for Thin Film SOFC Material using 2DD
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B-XRD2009 - Orientation Analysis of Organic Thin Film on Single Crystal Sub by In-plane XRD
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B-XRD2007 - Examination for Growth Process of Organic Thin Film by In-plane XRD
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B-XRD2006 - Crystal Orientation Evaluation of Epitaxial Film and Ultrathin Buffer Layers by In-plane Reciprocal Space Mapping
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B-XRD2005 - Orientation Analysis of Organic Thin Film on Rubbed Glass by In-plane XRD
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B-XRD2001 - Evaluation of Crystal Quality (Tilt and Twist Qidths) of Group-III Nitride Film by the Rocking Curve Method
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B-XRD1162 - In-situ Evaluation of Orientation in Polymer Films at Different Draw Ratios by Wide Angle X-ray Scattering
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B-XRD1119 - Quantitative Characterization of Polymer film by Orientation Function
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B-XRD1118 - Quick Pole Figure Measurement of a Metal Material using 2DD
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B-XRD1104 - Evaluation of Grain Condition and Orientation of Cemented carbide using 2D XRD
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B-XRD1063 - Measurement of a Film Sample
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B-XRD1014 - Crystal Orientation Analysis of Rolled Sheet Material by Pole Figure Measurement
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