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Examining a five-dimensional incommensurate composite crystal structure by X-ray diffraction

AppNote SMX006: Examining a five-dimensional incommensurate composite crystal structure by X-ray diffraction

Background

Modulated structures are a real test of a single crystal diffractometer. The presence of strong/intense Bragg reflections alongside weaker satellite peaks mean that, for successful characterization, it is compulsory to have the following:

  • A sensitive low noise detector with high dynamic range such as a Rigaku Oxford Diffraction CCD or HPAD to get accurate intensity measurements on even the weakest satellite peaks.
  • A powerful indexing and data reduction software package like CrysAlisPro to easily index the cell and multidimensional, multi-order satellite peaks as well as provide good results from data processing for solution and refinement in programs such as Jana2006.

Rigaku Oxford Diffraction’s sealed tube systems are an excellent match for conducting research on these materials