Cu Kα radiation is a useful source of radiation for general purpose X-ray diffraction experiments. Due to the approximate λ³ relationship with diffracted intensity, Cu Kα typically provides the strongest signal at the detector and thus enables faster experiments or easier study of small, weakly diffracting samples such metal organic frameworks (MOFs). Due to the stronger anomalous signal obtained from Cu Kα radiation vs. other common wavelengths it is possible to confirm the chirality for lighter atom structures such as purely organic materials with greater accuracy. Additionally, the longer wavelength of Cu Kα radiation can improve peak separation and consequently data quality for cases where reflection overlap is a concern, e.g. twinned crystals or long unit cell axes.