X-ray sources using Ag Kα radiation offer a shorter wavelength (0.56 Å) than the traditional Cu (1.54 Å) or Mo (0.71 Å) sources found in most home laboratory instruments. Shorter-wavelength, higher-energy X-rays, often called ‘hard’ X-rays, are generally absorbed to a lesser extent by samples, but also diffract with smaller angles such that there are more measurable reflections within a given theta angle when compared to long wavelengths. This can be exploited in a number of different ways. For samples containing heavy elements, absorption artefacts are minimized. For charge density measurements, more reflections are observed to higher resolution. For high-pressure measurements there are fewer inaccessible reflections as a result of the restrictive pressure cell.