Performing data collections which are not only high quality but also efficient is a key requirement of diffractometer users around the world, either to enable high throughput, or simply maximize data quality in a given time. The new XtaLAB Synergy diffractometer represents improvements in both hardware and software design. Advancements have been made not only in the microfocus sources but also in the goniometer hardware. The sample environment has been completely redesigned allowing ample space for easier access or incorporation of specialist equipment. The combination of these enhancements leads to better data quality in shorter data collection times for both weakly and strongly diffracting crystals.