Skip to main content

Elemental Analysis

Elemental analysis

Measure almost any element in almost any matrix

X-ray fluorescence (XRF) provides one of the simplest, most accurate and most economic analytical methods for the determination of elemental composition of many types of materials. Indispensable to both R&D and quality assurance (QA) functions, our advanced and unique WDXRF products are routinely used to analyze products from cement to plastics and from metals to food to semiconductor wafers. Rigaku offerings range from high power, high-performance wavelength dispersive WDXRF systems, for the most demanding applications, to a complete line of benchtop EDXRF and WDXRF systems.
 

 

Application notes

The following application notes are relevant to this application

WDXRF

EDXRF

Process

Total reflection XRF (TXRF)

X-ray topography (XRT)

Rigaku recommends the following systems:


WDXRF

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples

WDXRF spectrometer designed to handle very large and/or heavy samples

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

EDXRF

High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films

Variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

EDXRF spectrometer with powerful Windows® software and optional FP.

Total reflection XRF (TXRF)

The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer

Process

Scanning multi-element process coatings analyzers for web or coil applications

EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)