Since the introduction of CCD based area detectors for X-ray crystallography molybdenum has often been put forward as the best choice for a general purpose diffractometer system. The characteristics of molybdenum radiation, with its short wavelength and low absorption, made it a natural fit for the slower early CCD detectors and early software. However, the ever-growing popularity of dual source systems has enabled many chemical crystallographers to gain experience with copper as well as molybdenum sources. With recent advances in micro-focus source technology, detector technology and advanced data processing algorithms in Rigaku Oxford Diffraction’s CrysAlisPro software, copper is frequently a better alternative to molybdenum, and is therefore being increasingly used as the default X-ray source in many laboratories.
A benchtop single crystal X-ray diffractometer with the latest technology HPC X-ray detector, ideal for self-service crystallography.
An upgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples
Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab
Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator
Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments
Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components
Automated crystal transport, orientation and retrieval robot
User-inspired data collection and data processing software for small molecule and protein crystallography
Single wavelength Confocal Max-Flux (CMF) optics for single crystal diffraction
Low noise, sensitive, air-cooled X-ray detector for superior X-ray diffraction data quality
Compact, highly sensitive X-ray detector for single crystal applications
A unique curved single crystal X-ray diffraction detector
High resolution X-ray detectors for X-ray diffractometers from DECTRIS