Cu Kα radiation is a useful source of radiation for general purpose X-ray diffraction experiments. Due to the approximate λ³ relationship with diffracted intensity, Cu Kα typically provides the strongest signal at the detector and thus enables faster experiments or easier study of small, weakly diffracting samples such metal organic frameworks (MOFs). Due to the stronger anomalous signal obtained from Cu Kα radiation vs. other common wavelengths it is possible to confirm the chirality for lighter atom structures such as purely organic materials with greater accuracy. Additionally, the longer wavelength of Cu Kα radiation can improve peak separation and consequently data quality for cases where reflection overlap is a concern, e.g. twinned crystals or long unit cell axes.
A benchtop single crystal X-ray diffractometer with the latest technology HPC X-ray detector, ideal for self-service crystallography.
An upgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples
Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab
Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator
Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments
Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components
Automated crystal transport, orientation and retrieval robot
User-inspired data collection and data processing software for small molecule and protein crystallography
Single wavelength Confocal Max-Flux (CMF) optics for single crystal diffraction
Low noise, sensitive, air-cooled X-ray detector for superior X-ray diffraction data quality
Compact, highly sensitive X-ray detector for single crystal applications
A unique curved single crystal X-ray diffraction detector
High resolution X-ray detectors for X-ray diffractometers from DECTRIS