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Advanced semiquant analysis by 'SQX Scatter FP' method

AppNote XRF1036: semiquant analysis by 'SQX Scatter FP' method

Background

Semi-quantitative analysis by the Fundamental Parameter (FP) method is a unique and powerful method for elemental screening of materials. In the FP calculation, the program requires principally the information of all elements included in a specimen for analysis. This requirement is not convenient when the specimen contains large amount of ultra-light elements from hydrogen to oxygen, which are difficult to determine accurately or non-measureable elements on X-ray spectrometry. In 2005, Rigaku developed a new method to estimate an average atomic number for non-measured elements from hydrogen to oxygen in a specimen using the intensities of scattered X-rays and applied the estimation to the semi-quantitative FP calculation (SQX) as a balance component. The successfully advanced SQX method using scattering intensities, the SQX Scatter FP method becomes available for oxide powders on the newly developed benchtop XRF spectrometer, Supermini200.

WDXRF products from Rigaku

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

High power, tube above, sequential WDXRF spectrometer

WDXRF spectrometer designed to handle very large and/or heavy samples

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

WDXRF ultra low sulfur analyzer for method ASTM D2622

ASTM D2622 method WDXRF analyzer for sulfur (S) in petroleum fuels and ULSD

Tube below, single element WDXRF analyzer for quality control applications