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Additive elements in polymer using ZSX Primus series w/ AppPak

AppNote XRF1069: elements in polymer using ZSX Primus w/ AppPak

Background

This application note introduces an Application Package for quantitative analysis of additive elements in polymer. The Application Package includes calibration standards and drift correction samples required for the quantitative analysis, the step-by-step instruction manual, etc. This Polymer Application Package makes it easy to set up the quantitative analysis application by the use of polyethylene disk specimens as calibration standards. The Polymer Application Package is applicable to Rigaku sequential wavelength-dispersive XRF spectrometer, ZSX Primus, ZSX Primus II, ZSX Primus III+ and ZSX Primus IV. For Mg, Na and F analysis, an optional high-sensitivity crystal RX35 is required. In addition, an optional Ge crystal is needed for the ZSX Primus III+. ZSX Primus IV uses high-sensitivity crystals, GeH and PETH instead of conventional Ge and PET crystals. The analysis area is 30 mm in diameter.

WDXRF products from Rigaku

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

High power, tube above, sequential WDXRF spectrometer

WDXRF spectrometer designed to handle very large and/or heavy samples

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

WDXRF ultra low sulfur analyzer for method ASTM D2622

ASTM D2622 method WDXRF analyzer for sulfur (S) in petroleum fuels and ULSD

Tube below, single element WDXRF analyzer for quality control applications