One of the features of X-ray fluorescence (XRF) spectrometry is that a large area, such as 30 mm in diameter, can be measured on the surface of a specimen, which appropriately represents an analysis sample. On the other hand, there has been a demand to measure a small spot on the surface on a specimen (point analysis) or to obtain information of elemental distribution on the surface of a specimen (mapping analysis). Although there are XRF spectrometers dedicated for point or mapping analysis available in the market, it is not possible to perform large area analysis with these models. Rigaku ZSX Primus IV and ZSX Primus, general- purpose wavelength-dispersive XRF (WDXRF) spectrometers, enable point and mapping analysis. This note demonstrates point and mapping analysis function of ZSX Primus IV / Primus by analyzing a granite rock chip.
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer
WDXRF spectrometer designed to handle very large and/or heavy samples
High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U