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Nanoparticle size analysis using SAXS and XRD techniques

AppNote XRD-SLNA_02: nano-particle size analysis using SAXS and XRD

Background

X-ray techniques are often used to estimate the size of nanoparticles in the range of 1 – 100 nm because the commonly used X-ray’s wavelength, 0.154 nm for Cu Ka radiation for instance, is close to the size of nanoparticles and sensitive to the change of their size, shape, structure etc. Two techniques are used to estimate the size of nanoparticles: Small Angle X-ray Scattering (SAXS) and X-ray Diffraction (XRD). Both techniques provide the estimated size but use different types of scattering. This means that additional information about the nanoparticles can be extracted by comparing the results from those two techniques. SAXS: Diffuse scattering (Sample can be amorphous or crystalline.) XRD: Diffraction (Sample needs to be crystalline.) The SAXS and XRD techniques are applied to nanoparticle samples and the differences between the results are discussed in this presentation.

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