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Phase identification of an organic thin film by GI-WAXS measurement with a 2D detector

AppNote B-XRD2023: Phase identification of an organic thin film by GI-WAXS measurement with a 2D detector

Background

The grazing incidence wide angle X-ray scattering (GI-WAXS) technique, where an incident X-ray beam strikes a specimen surface at a very shallow angle, is often employed for the measurement of ultra-thin film specimens, since their very weak signals can be effectively observed this way. The combination of the 2D-SAXS/WAXS attachment with an aperture slit and a 2D detector allows clearly resolved 2D diffracted images to be obtained using a general X-ray diffractometer with a line-shaped incident beam.

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