The grazing incidence wide angle X-ray scattering (GI-WAXS) technique, where an incident X-ray beam strikes a specimen surface at a very shallow angle, is often employed for the measurement of ultra-thin film specimens, since their very weak signals can be effectively observed this way. The combination of the 2D-SAXS/WAXS attachment with an aperture slit and a 2D detector allows clearly resolved 2D diffracted images to be obtained using a general X-ray diffractometer with a line-shaped incident beam.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Windows®-based software suite for Rigaku's X-ray diffractometers
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers