Background
Reciprocal space mapping (RSM) is an XRD technique used to evaluate the lattice spacing and orientation distribution of thin film materials, especially for epitaxial films. The TDI (time delay integration) scan mode of a 2-dimensional X-ray detector can obtain wide-range RSM in a relatively short time. The combination of reciprocal lattice simulation with uniaxial orientation, a new function of SmartLab Studio II, can easily evaluate film orientation.
XRD products from Rigaku
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers