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Fe, Ni and Co Based Alloy Analysis

AppNote XRF1096: Fundamental Parameter Method Using ZSX PrimusIII+


Fe, Ni and Co based alloys, including high-temperature alloys, tool steel, and stainless steel, have broad ranges of concentrations for many elements. These alloys are analyzed during production control by X-ray fluorescence (XRF) spectrometry. The calibration curves have to be separated into many groups when using the empirical calibration method even if matrix correction is introduced, because of strong inter-element absorption and enhancement effects.

The basic theoretical formula of the fluorescent X-ray intensity for the Fundamental Parameter (FP) Method was established by Sherman(1) in 1955. Shiraiwa and Fujino(2) completed the formula by correcting for secondary excitation.

In 1983, Rigaku became the first XRF manufacturer to introduce FP method software for a wavelength -dispersive (WD)XRF spectrometer, and the FP method has been widely used from screening analysis as semi-quantitative analysis to production control in many industries.

In this application note, quantitative analysis by the FP method for Fe, Ni and Co based alloys using the ZSX PrimusIII+ is demonstrated.

WDXRF Products from Rigaku

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

High power, tube above, sequential WDXRF spectrometer

WDXRF spectrometer designed to handle very large and/or heavy samples

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

WDXRF ultralow chlorine analyzer

WDXRF ultra low sulfur analyzer for method ASTM D2622

ASTM D2622 method WDXRF analyzer for sulfur (S) in petroleum fuels and ULSD

Tube below, single element WDXRF analyzer for quality control applications