XRF is an analysis tool used for non-destructive analysis in industrial forensics to identify and resolve manufacturing issues or contamination within the production and distributor processes. Analysis using XRF gives the operator a way to determine elemental composition of foreign material in failure analysis and root cause analysis to optimize quality control and testing procedures.
EDXRF is a fast and simple means of obtaining elemental composition of samples investigated in industrial forensics. Samples analyzed are often irregularly shaped, small or available in only small quantity. Rigaku NEX DE VS EDXRF analyzer is an excellent tool equipped with small spot size measurement, camera image and powerful yet simple-to-use software for the investigation and identification of foreign material.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
EDXRF spectrometer with powerful Windows® software and optional FP.