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Products from Rigaku

XRD products

Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods

2D X-ray detector with latest semiconductor technology designed for home lab diffractometers

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

WDXRF products

WDRFA Spektrometer für niedrige Schwefelgehalte nach ASTM D2622 und ISO 20884

WDRFA Spektrometer für niedrige Schwefelgehalte nach ASTM D2622 und ISO 20884

Tube below, single element WDXRF analyzer for quality control applications

ASTM D2622 method WDXRF analyzer for sulfur (S) in petroleum fuels and ULSD

High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U

Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

WDXRF spectrometer designed to handle very large and/or heavy samples

High power, tube above, sequential WDXRF spectrometer

Sequenzielles WDRFA-Spektrometer mit hoher Leistung, Röhre oberhalb der Probe, mit ZSX Guidance Systemsoftware

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

EDXRF products

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

EDXRF spectrometer with powerful Windows® software and optional FP.

Scanning multi-element process coatings analyzers for web or coil applications

Small molecule crystallography products

Automated crystal transport, orientation and retrieval robot

User-inspired data collection and data processing software for small molecule and protein crystallography

High-resolution X-ray detectors for X-ray diffractometers from DECTRIS

Low noise, sensitive, air-cooled X-ray detector for superior X-ray diffraction data quality

A unique curved single crystal X-ray diffraction detector

A unique curved single crystal X-ray diffraction detector

Compact, highly sensitive X-ray detector for single crystal applications

A benchtop single crystal X-ray diffractometer with the latest technology HPC X-ray detector, ideal for self-service crystallography.

Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components

Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments

Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments

An upgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples

Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator

Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab

Protein crystallography products

Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab

Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator

Small angle X-ray scattering (SAXS) Kratky camera system

Single wavelength Confocal Max-Flux (CMF) optics for single crystal diffraction

Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers

Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers

Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab

Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments

Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments

User-inspired data collection and data processing software for small molecule and protein crystallography

A unique curved single crystal X-ray diffraction detector

A unique curved single crystal X-ray diffraction detector

Low noise, sensitive, air-cooled X-ray detector for superior X-ray diffraction data quality

High-resolution X-ray detectors for X-ray diffractometers from DECTRIS

Automated crystal transport, orientation and retrieval robot

X-ray imaging products

High-speed, stationary sample microtomography of large samples

High-resolution benchtop microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

Raman products

Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.

 The original handheld 1064 nm Raman analyzer to expand incident response by identifying more chemical threats and narcotics

Narcotics-focused analyzer to identify the latest opioid and fentanyl formations

Improved ergonomics for more convenient identification and detection of chemical threats and narcotics – even in non-visible amounts - using the 1064 nm Raman advantage

Semiconductor metrology products

Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.

Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.

Trace elemental surface contamination metrology by TXRF; up to 300 mm wafers

Ultra-trace elemental surface contamination metrology by TXRF with VPD capability; up to 300 mm wafers

In-line, simultaneous WDXRF spectrometer for wafer metal film metrology; up to 300 mm wafers

Simultaneous WDXRF spectrometer for wafer metal film metrology; up to 200 mm wafers

Sequential WDXRF spectrometer for elemental analysis and thin-film metrology of large and/or heavy samples

Process XRR, XRF, and XRD metrology tool for blanket and patterned wafers; up to 300 mm wafers

XRF and optical metrology tool for blanket and patterned wafers; up to 300 mm wafers

SAXS products from Rigaku

Small angle X-ray scattering (SAXS) Kratky camera system

Special CMF optic designed for SAXS instrumentation

A modernized 2D Kratky system that eliminates data corrections required of traditional systems

Small and wide angle X-ray scattering instrument designed for nano-structure analyses

Small and wide angle X-ray scattering instrument designed for nano-structure analyses

Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

Thermal analysis products

TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).

 

 

DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.

Quantifies the energy changes in reactions such as melting, transition, crystallization and glass transition temperature.

DSC8271 is a high-temperature type DSC with a maximum temperature of 1,500°C.

TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.

 

The compact humidity generator (HUM-1) is connected to the TG-DTA for measurements under constant relative humidity water vapor atmosphere.

 

TMA/HUM measures change in dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.

Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry. This technique is suitable for the qualitative analysis of  evolved gases coincident with the STA signal.

Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry. This technique is suitable for the qualitative analysis of  evolved gases coincident with the STA signal.

In TG-FTIR, gases evolved by volatilization or thermal decomposition are qualitatively analyzed, which allows you to track changes in the generated amount along with the temperature change.

In TG-FTIR, gases evolved by volatilization or thermal decomposition are qualitatively analyzed, which allows you to track changes in the generated amount along with the temperature change.