- Extremely high performance due to bright source, noise-free X-ray detector and fast goniometer speeds
- Continuously variable divergence slit option lets you resolve reflections from long unit cells.
- Minimal downtime with longer X-ray tube lifetime - supported by online diagnostics and troubleshooting
- Compact design to fit in your laboratory
Single or dual microfocus X-ray diffractometer for all your crystallography needs
A fast and agile single crystal X-ray diffractometer for small molecule 3D structure analysis
With your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces fast, accurate data in an intelligent fashion. The system is based around the PhotonJet-S series of microfocus X-ray sources that optionally incorporate continuously variable divergence slits. These third generation sources have been designed to maximize X-ray photons at the sample by using a combination of new optics, new, longer life tubes and an improved alignment system. PhotonJet-S sources are available in Cu, Mo or Ag wavelengths in either a single or dual source configuration. The XtaLAB Synergy-S single crystal X-ray diffractometer comes with kappa goniometer that incorporates fast motor speeds and a unique telescopic two-theta arm to provide total flexibility for your diffraction experiment. The system is also equipped with your choice of HPC digital X-ray photon counting detector, including the HyPix-Arc 150°, HyPix-6000HE or EIGER 1M.
|Single crystal X-ray diffraction
|3D structural analysis of molecules
|Single crystal X-ray diffractometer
|Single or dual X-ray source diffractometer with hybrid pixel array detector and kappa goniometer
|Oxford Cryostream Cooler and XtalCheck-S
|External PC, MS Windows® OS
|1300 (W) x 1875 (H) x 850 (D) mm
|550 kg (core unit)
|1Ø, 90-130V 15A or 180-260V 4A