In addition to evaluation of crystal structure, X-ray diffractometry enables evaluation of periodic structure called "long-period structure." For this long-period structure, it is necessary to observe a period a few times to a few tens of times longer than the periodic structure of atoms or molecules in ordinary crystals, and thus evaluation using small-angle scattering measurement becomes important. Structural changes due to heating, stretching, magnetic fields and other external factors are often seen, particularly in samples such as polymers and rubber which have both a crystal structure (micro structure) and long-period structure (macro structure). New findings can be obtained by evaluating both crystal structure and long-period structure while varying these external factors.
Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components
Small angle X-ray scattering (SAXS) Kratky camera system
Small and wide angle X-ray scattering instrument designed for nano-structure analyses