Direkt zum Inhalt

Observation of strain-induced crystallization of natural rubber

AppNote B-XRD1028: strain-induced crystallization of natural rubber

Background

In addition to evaluation of crystal structure, X-ray diffractometry enables evaluation of periodic structure called "long-period structure." For this long-period structure, it is necessary to observe a period a few times to a few tens of times longer than the periodic structure of atoms or molecules in ordinary crystals, and thus evaluation using small-angle scattering measurement becomes important. Structural changes due to heating, stretching, magnetic fields and other external factors are often seen, particularly in samples such as polymers and rubber which have both a crystal structure (micro structure) and long-period structure (macro structure). New findings can be obtained by evaluating both crystal structure and long-period structure while varying these external factors.

SAXS products from Rigaku

Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components

Small angle X-ray scattering (SAXS) Kratky camera system

Small and wide angle X-ray scattering instrument designed for nano-structure analyses

Small and wide angle X-ray scattering instrument designed for nano-structure analyses

A modernized 2D Kratky system that eliminates data corrections required of traditional systems

Special CMF optic designed for SAXS instrumentation

Multipurpose products from Rigaku

Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

High-performance, multi-purpose XRD system for applications ranging from R&D to quality control