Elemental, phase and residual stress analysis
Quality production demands control of material properties throughout the entire process from raw material to finished product. The speed and precision of X-ray fluorescence (XRF) elemental analysis make it a preferred testing method in high sample throughput chemical analysis. In addition to alloy stoichiometry, X-ray diffraction (XRD) examines phase composition, retained austenite concentration or residual stress, which correlate with structural quality of your products.
Rigaku recommends the following systems:
WDXRF
Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification
Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification
EDXRF
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
X-ray CT
Stress
The world’s smallest portable stress analyzer that is specifically designed for field analysis
