Elemental, phase and residual stress analysis
Quality production demands control of material properties throughout the entire process from raw material to finished product. The speed and precision of X-ray fluorescence (XRF) elemental analysis make it a preferred testing method in high sample throughput chemical analysis. In addition to alloy stoichiometry, X-ray diffraction (XRD) examines phase composition, retained austenite concentration or residual stress, which correlate with structural quality of your products. Within a very few seconds, the Rigaku KT-100S handheld metal analyzer easily performs identification of the most difficult alloy grades. The device utilizes laser induced breakdown spectroscopy (LIBS), enabling durable and accurate alloy identification for metal sorting, quality assurance and positive material identification (PMI) in mission-critical operations.
Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer
High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
EDXRF spectrometer with powerful Windows® software and optional FP.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
High-speed, stationary sample microtomography of large samples
The world’s smallest portable stress analyzer that is specifically designed for field analysis
Compact 2D X-ray camera with micron and sub-micron resolution for imaging