Elemental, phase and residual stress analysis
Quality production demands control of material properties throughout the entire process from raw material to finished product. The speed and precision of X-ray fluorescence (XRF) elemental analysis make it a preferred testing method in high sample throughput chemical analysis. In addition to alloy stoichiometry, X-ray diffraction (XRD) examines phase composition, retained austenite concentration or residual stress, which correlate with structural quality of your products.
Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern
High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
EDXRF spectrometer with powerful Windows® software and optional FP.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
High-speed, stationary sample microtomography of large samples
High-resolution benchtop microtomography of large samples
Compact 2D X-ray camera with micron and sub-micron resolution for imaging
Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification