Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U
Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern
Sequenzielles WDRFA-Spektrometer mit hoher Leistung, Röhre oberhalb der Probe, mit ZSX Guidance Systemsoftware
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
User-inspired data collection and data processing software for small molecule and protein crystallography
Low noise, sensitive, air-cooled X-ray detector for superior X-ray diffraction data quality
A benchtop single crystal X-ray diffractometer with the latest technology HPC X-ray detector, ideal for self-service crystallography.
Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components
Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments
Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments
An upgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples
Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator
Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab
Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab
Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator
Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers
Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers
Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab
Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments
Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments
User-inspired data collection and data processing software for small molecule and protein crystallography
Low noise, sensitive, air-cooled X-ray detector for superior X-ray diffraction data quality
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
The original handheld 1064 nm Raman analyzer to expand incident response by identifying more chemical threats and narcotics
Improved ergonomics for more convenient identification and detection of chemical threats and narcotics – even in non-visible amounts - using the 1064 nm Raman advantage
Improved ergonomics for more convenient identification and detection of chemical threats and narcotics – even in non-visible amounts - using the 1064 nm Raman advantage
Ultra-trace elemental surface contamination metrology by TXRF with VPD capability; up to 300 mm wafers
In-line, simultaneous WDXRF spectrometer for wafer metal film metrology; up to 300 mm wafers
Sequential WDXRF spectrometer for elemental analysis and thin-film metrology of large and/or heavy samples
Process XRR, XRF, and XRD metrology tool for blanket and patterned wafers; up to 300 mm wafers
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
Quantifies the energy changes in reactions such as melting, transition, crystallization and glass transition temperature.
TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.
The compact humidity generator (HUM-1) is connected to the TG-DTA for measurements under constant relative humidity water vapor atmosphere.
TMA/HUM measures change in dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.
Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry. This technique is suitable for the qualitative analysis of evolved gases coincident with the STA signal.
Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry. This technique is suitable for the qualitative analysis of evolved gases coincident with the STA signal.
In TG-FTIR, gases evolved by volatilization or thermal decomposition are qualitatively analyzed, which allows you to track changes in the generated amount along with the temperature change.
In TG-FTIR, gases evolved by volatilization or thermal decomposition are qualitatively analyzed, which allows you to track changes in the generated amount along with the temperature change.