Max-Flux TXRF
Features
- Easy Alignment
- Increased intensity on sample
- Greatly decreased background, especially from spurious lines from the x-ray source
- Excellent control of X-ray beam profile and divergence
- Improved data collection
- Available for Cu, Mo, Co, Ag, Au, Cr, W Kα, W Kβ and other X-ray energies
Focusing graded multilayer monochromator
Maximizes intensity on the sample within the total external reflection angle for TXRF
Specifications
Product name | Max-Flux TXRF optic |
Technique | For Total Reflection X-ray Fluorescence spectrometry |
Benefit | Increased intensity on the sample |
Technology | Multilayer elliptical optics |
Core attributes | Excellent Kα/Kβ ratio |
Core options | Custom designed |
Computer | N/A |
Core dimensions | Varies with configuration |
Mass (core unit) | Varies with configuration |
Power requirements | N/A |