ZSX Primus III+
Features
- Analysis of elements from O to U
- Tube above optics minimizes contamination issues
- Small footprint uses less valuable lab space
- High precision sample positioning
- Special optics reduce errors caused by curved sample surfaces
- Software tools for statistical process control (SPC)
- Evacuation and vacuum leak rates can be optimized for throughput
Tube-above sequential wavelength dispersive X-Ray fluorescence spectrometer
Elemental analysis of solids, liquids, powders, alloys and thin films
Specifications
Product name | ZSX Primus III+ |
Technique | X-ray fluorescence (XRF) |
Benefit | Elemental analysis of solids, liquids, powders, alloys and thin films |
Technology | Tube above sequential wavelength dispersive (WDXRF) |
Core attributes | 3 kW sealed X-ray tube, 48-position autosampler, analyze O to U, vacuum |
Core options | Additional analyzing crystals |
Computer | External PC, MS Windows® OS, ZSX software |
Core dimensions | 1310 (W) x 1480 (H) x 850 (D) mm |
Mass | Approx. 620 kg (core unit) |
Power requirements | 1Ø, 200 VAC 50/60 Hz, 7 kW |