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ZSX Primus IVđť’ľ
Features
Assisted measurement and analysis support: ZSX Guidance
Automated analysis settings features enhanced third-generation SQX analysis software
ZSX Guidance software
Built-in XRF expertise handles sophisticated settings. Available application packages enable turn-key operations.
Intuitive software programmable for everyday analysis using sample trays
Sample ID settings for each tray (facilitates easy copy-and-paste for efficient measurement setup).
Improved accuracy of liquid sample analysis
Correction of geometry effect caused by geometry of liquid sample cups.
High-speed, high-precision measurements
Efficiency of the new drive sequence decreases instrument overhead time
Unique functionality
The tube-below optics enables convenient functionality, including new sample film corrections.

In addition to the application notes listed below, these new documents are available for request:

Tube-below sequential wavelength dispersive X-Ray fluorescence spectrometer

Uncompromised X-ray analysis of liquids, alloys, and plated metals

The tube-below high-performance model enables uncompromised analysis of samples such as liquids, alloys, and plated metals. Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus IV? WDXRF spectrometer features a 30 micron Be tube window, the thinnest standard tube window in the industry, for exceptional light element (low-Z) detection limits.

Vacuum (partition) system for analyzing liquids

Because the spectrometer chamber is always under vacuum, the change from vacuum atmosphere to helium atmosphere is completed in less than two minutes. Furthermore, the consumption of helium gas is significantly reduced compared to models where the spectrometer chamber must also be purged.

Improved throughput

Improved mechanics minimize the analysis dead time. For example, a 16-element sequential quantitative measurement time improved from 348 seconds to 287 seconds, representing an 18% increase in efficiency. 

D-MCA high-speed analysis

The Digital Multi-Channel Analyzer (D-MCA) system facilitates high-speed digital processing for high count rates for improved analytical precision and increased throughput speeds.

Optical system not easily impacted by sample surface height variations

An uneven sample surface causes variations in the distance between the sample and the X-ray tube. These differences can lead to changes in the X-ray intensity. Rigaku optical systems enable suppression of X-ray intensity changes caused by variation in distance. This enables accurate analysis by minimizing the impact of shape differences from fusion molds used in glass bead formulation and the impact of uneven sample surfaces during pressing of powder samples.

Point/mapping analysis

Equipped with a high-resolution camera that allows the user to zoom in on small features for proper identification and analysis. Enables accurate analysis by eliminating differences in sensitivity caused by measurement placement. Superior design uses the hot-spot of the tube to maximize intensity/sensitivity. 

Refined SQX analysis

SQX analysis is standardless FP analysis software for calculation of accurate elemental composition. Now easier to use than ever. 

Automated center wire cleaning mechanism

The F-PC detector center wire gradually becomes contaminated by proportional counter quench gas, which diminishes resolution. The center wire cleaning mechanism enables restoration of performance by eliminating center wire contamination by means of electrical heating, with no need to shut off the power source or to open the cabinet.


Learn more about our products at these events

Booth number Date Location Event website
MRS Spring 2024 - Seattle, WA Website
Ceramics Expo 2024 - Novi, MI Website
The Advanced Materials Show - Birmingham, United Kingdom Website
Webinar: Illuminating The World of Sub-Micron Crystal Structures with the XtaLAB Synergy-ED: A Review Webinar Register Now
Canadian Chemistry Conference and Exhibition (CSC 2024) - Winnipeg, MB, Canada Website
JCAT54 - Clermont-ferrand, France Website
European Conference on Residual Stresses - ECRS11 - Prague, Czech Republic Website
UKPorMat - Liverpool, United Kingdom Website
LABOREXPO 2024 - Prague, Czech Republic Website
30th Croatian-Slovenian Crystallographic Meeting - Veli Losinj, Croatia Website
Zurich School of Crystallography - Zurich, Switzerland Website
Webinar: Non-destructive Elemental Analysis of Batteries Using XRF Webinar Register now
European Conference on X-ray Spectrometry - Athens, Greece Website
Konwersatorium Krystalograficzne - Wrocław, Poland Website
AFC 2024 (French Cristallography Meeting) - Montpelier, France Website
ACA 2024 - Denver, CO Website
DXC 2024 - Westminster, CO Website
Webinar: Nondestructive inspection of batteries using X-ray Computed Tomography Webinar Register now
ECM2024 - Padova, Italy Website
Epdic 18 - Padova, Italy Website
Labelexpo Americas 2024 - Chicago, IL Website
GSA 2024 - Anaheim, CA Website
ICSCRM 2024 - Raleigh, NC, United States Website
11th Meeting of the Young Crystallographers at Rigaku - Neu-Isenburg, Germany Learn more
MS&T24 2024 - Pittsburgh, PA Website

Upcoming training sessions

Title Dates Cost Location Notes Course outline Registration form
ZSX Primus IV & Supermini200 training (Europe) - Please contact ECOE@rigaku.com Neu-Isenburg, Germany ZSX Primus IV & Supermini200 training Class outline Registration form
ZSX Primus IV & Supermini200 training (Europe) - Please contact ECOE@rigaku.com Neu-Isenburg, Germany ZSX Primus IV & Supermini200 training Class outline Registration form
XRF Training (Hybrid, The Woodlands, TX) - $4200 Hybrid Class outline Registration form
ZSX Primus IV & Supermini200 training (Europe) - Please contact ECOE@rigaku.com Neu-Isenburg, Germany ZSX Primus IV & Supermini200 training Class outline Registration form