- True submicron resolution by parallel beam geometry coupled with an ultra-thin scintillator and optical lens magnification
- High-contrast for low-density materials by selectable characteristic radiations (Cr 5.4 keV, Cu 8 keV, Mo 17 keV) additional to bremsstrahlung radiation from W target
- Easy radiation selection by the dual-wavelength X-ray source
- Fast scans by the MicroMax-007 high-power (1200 W) rotating anode X-ray source and sCMOS detector
True submicron high-contrast X-ray computed tomography
Rigaku nano3DX represents the state of the art in laboratory-based nanoscale X-ray imaging. With up to 100X the X-ray flux of conventional microfocus X-ray sources, the nano3DX provides fast, true sub-micron 2D, 3D, and 4D measurements for a wide range of sample types.
High-resolution: High-quality CT images are obtained at submicron resolution by utilizing parallel beam X-ray geometry coupled with an ultra-thin scintillator and optical lens magnification.
High-contrast for lighter materials: The contrast in samples with low-density (organics, composites, ceramics, polymers, light metals, and minerals) is enhanced by utilizing high-power (1200 W) quasi-monochromatic radiations from 5.4 keV to 17 keV.
High-speed: A combination of the high-flux X-ray source and an sCMOS detector enhances sample throughput and enables high-resolution 4D measurements for time-resolved in-situ experiments.
|True submicron high-contrast X-ray computed tomography
|X-ray computed tomography
|MicroMax-007 HF rotating anode X-ray generator
|20 to 60 kV
|up to 30 mA
|Cr, Cu, Mo, and W
|Field of view
|Maximum 10 mm
|Maximum 325 nm