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Rigaku Journal (ISSN 2187-9974)

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Winter 2024, Volume 40, No. 1


Winter 2024, Vol. 40, No. 1

Performance Evaluation of the High Frame Rate Detector XSPA

Yasukazu Nakaye, Yasutaka Sakuma, Takuto Sakumura, Satoshi Mikusu and Kazuyuki Matsushita


In recent years, Hybrid Photon Counting (HPC) detectors have been widely used in the field of X-ray measurement. These detectors display no readout noise and provide a large dynamic range, high frame rate, small point spread function and no blurring. By combining these advantages of HPC detectors with high-speed...

Beyond static structure: X-ray solution scattering: MAXS reveals a massive movement during catalytic action of the non-phosphorylated human kinase MAP2K4

Takashi Matsumoto, Akihito Yamano, Yuka Murakawa, Harumi Fukada, Masaaki Sawa and Takayoshi Kinoshita


Small angle X-ray scattering (SAXS) is a well-known technique for analyzing the size and shape of proteins in solution. Standard SAXS uses data below about q = 0.25 Å⁻¹. Therefore, SAXS can only provide information regarding size changes in the target molecule, aggregation, and approximate molecular shape. On the...

Wavelength dispersive X-ray fluorescence spectrometer - ZSX Primus III NEXT


X-ray fluorescence analysis is an elemental analysismethod that can quickly and nondestructively analyze elements contained in a sample with simple sample preparation. Furthermore, it is widely used for process control and quality control analysis of steel, cement, refractories, and other materials owing to its excellent measurement reproducibility.

To meet...

Thermoplus EVO3 DSCvesta2: DSC with a newly designed thermal sensing plate


Thermal analyzers are widely used in various material fields. Specifically, the DSC (Differential Scanning Calorimeter) is an essential tool for investigating glass-transition temperature and melting points of polymers and pharmaceuticals. In 2017, Rigaku released DSCvesta®, which had a higher sensitivity, better stability, and wider measurement-temperature range than earlier models...

Total X-ray Scattering (TXS) Plugin


The local structure of materials is closely related to their functional properties, a subject that has been extensively studied for cathode materials, solid electrolytes and anode materials for Li-ion batteries, ferroelectric materials (BaTiO₃) and so forth. Pair distribution function (PDF) analysis is widely used to evaluate local structure in materials...

Summer 2023, Volume 39, No. 2


Summer 2023, Vol. 39, No. 2

Bulk chemical composition of samples recovered from asteroid Ryugu

Hisashi HOMMA and Kazuko MOTOMURA

 — Analysis of extraterrestrial material by WDXRF and TG-MS —


Spacecraft HAYABUSA2 successfully collected a 5.4 g sample from the surface of asteroid Ryugu that was returned to Earth on Dec. 6, 2020. Analysis of the asteroid Ryugu sample was performed using a ZSX Primus IV wavelength dispersive X-ray...

Dramatic improvement in the throughput of X-ray topography

Kenta Shimamoto


Rigaku launched a high-speed X-ray topography system with the improved throughput of 10–20 wafers/hour (3–6 min/wafer). High-speed image acquisition is achieved using an uncollimated divergent beam and the HyPix-3000HE hybrid pixel detector. This technical note explains two major features that contribute to this improvement by dramatically reducing the time...

Powder X-ray Diffraction Basic Course Fifth Installment: Quantitative analysis

Takahiro Kuzumaki


Powder X-ray diffraction is widely used as an analytical method to evaluate various crystalline materials. This paper describes the basics and evaluation examples of the RIR (Reference Intensity Ratio) method and the Rietveld method.

In the RIR method, quantitative analysis is performed based on the integrated intensity of diffraction...

Powder X-ray Diffraction Basic Course Sixth Installment: Evaluation of crystallite size

Masaaki Konishi


Powder X-ray diffraction (PXRD) can obtain a variety of information, not just a single piece of information. In the fifth installment of the powder X-ray diffraction basic course, quantitative analysis was described. This sixth installment describes the evaluation of crystallite sizes.

The Scherrer method is one analysis technique commonly...

XSPA-400 ER - X-ray seamless pixel array detector

The XSPA-400 ER (XSPA: X-ray Seamless* Pixel Array, ER: Energy Resolution) is a next-generation 2D semiconductor detector with a higher energy resolution than conventional models. With this higher energy resolution, the XSPA-400 ER reduces X-ray fluorescence, which can be a significant source of background intensity for powder diffraction patterns on...