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Rigaku Journal (ISSN 2187-9974)

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Summer 2022, Volume 38, No. 2


Summer 2022, Vol. 38, No. 2

Quantification analysis of cement materials

Atsushi Ohbuchi, Takahiro Kuzumaki, Miki Kasari and Tetsuya Ozawa

X-ray diffractometry is widely used for quality control and process control in cement. This article presents an accurate and precise quantification method for free lime in a clinker material and an accurate quantification method of the admixtures in a blended cement. The partial accumulation measurement was used to make a...

Three-dimensional modeling for complex structures based on small-angle X-ray scattering

Tomoyuki Iwata

Three-dimensional real-space modeling for hierarchical materials by matching experimental and simulated small-angle X-ray scattering patterns is proposed. The positional arrangements of small primary particles in the cell are estimated by the reverse Monte Carlo modeling and the simulated SAXS patterns are derived from these models. This modeling has been applied...

Compact X-ray Diffractometer MiniFlex XpC

X-ray diffraction (XRD) has traditionally been utilized mainly in the R&D field. Recently, however, opportunities to use XRD in the QA/QC field are increasing since the XRD technique has become easier to use with the popularization of desktop X-ray diffractometers and high-speed 1D semiconductor strip detectors (1D SSD). Rigaku has...

Winter 2022, Volume 38, No. 1


Winter 2022, Vol. 38, No. 1

Thank you very much for reading the “Rigaku Journal”

Hikaru Shimura

For the past 70 years, since the founding of our company in 1951, our management philosophy has been to “contribute to the enhancement of humanity through scientific and technological development.” By aligning ourselves with the enterprises and institutes pushing the boundaries of possibility over these seven decades, we have continuously expanded our portfolio of original technologies. These...

Breaking the 1-μm barrier with the electron diffractometer XtaLAB Synergy-ED

Sho Ito and Akihito Yamano

3D electron diffraction (3D ED)/Micro electron diffraction (MicroED) is a technique that can provide measurers with three-dimensional molecular structures from crystals of submicron order. However, 3D ED/Micro ED requires expertise in both electron microscopy and crystallography. Here, we introduce the newly developed electron diffractometer XtaLAB Synergy-ED specialized for 3D ED/MicroED experiments, its instrument...

Powder X-ray Diffraction Basic Course Fourth Installment: Qualitative analysis

Miki Kasari

An essential feature of the qualitative analysis of the powder X-ray diffraction (PXRD) method is that this provides information on the sample’s crystal structure, which often affects the properties and functions of the material. The qualitative analysis by the PXRD method is a phase identification method based on the matching of known...

Chemical State Analysis by X-ray Emission Spectroscopy

Hikari Takahara, Takashi Shoji and Yoshiaki Ito

X-ray emission spectroscopy (XES) is a chemical state analysis method. It is possible to show the change in a compound’s bonding state profile by measuring fluorescent X-rays with high energy resolution. Recently, the XES method has been evaluated in the field of advanced materials such as battery materials and catalysts, and the...

Wide-Angle X-ray Scattering Instrument NANOPIX-WE

In recent years, many countries have become increasingly concerned about environmental issues, and are accelerating their efforts to reduce their environmental impact by reducing dependence on fossil fuels (coal and oil) to achieve the carbon neutral. Developed countries and manufacturers are creating social policies and manufacturing strategies for low environmental load. Thus, the demand for advanced polymer materials...