Winter 2019, Volume 35, No. 1

Technical articles

  • Determination of molecular structure of odor components based on crystalline sponge method by Hiroyasu Sato and Akihito Yamano
  • GI-XRD measurements of thin film samples using a 2D detector and 2D-SAXS/WAXS attachment by Shintaro Kobayashi and Katsuhiko Inaba
  • Evaluation of crystalline polymer materials using a 2D-SAXS/WAXS system by Yukiko Namatame and Keigo Nagao
  • Cement analysis by wavelength dispersive XRF spectrometry by Hisashi Homma
  • Foreign material analysis using energy dispersive X-ray fluorescence spectrometers by Yasushi Kusakabe
  • Trace elemental analyses of beverages and biological materials by TXRF spectrometry by Atsushi Ohbuchi and Hikari Takahara

New Products

  • 3D X-ray micro CT - CT Lab HX
  • Graphite/graphene analytical index calculator - GG Index
  • 3D viewer for diffraction space - Ewald3D