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Rigaku nano3DX is a true X-ray microscope (XRM) with ultra-wide field of view, 25X larger volume than comparable systems, and three X-ray wavelengths for different matrices.Read more...
HyPix-3000 is a next-generation two-dimensional hybrid pixel array semiconductor detector designed specifically to meet the needs of the home lab diffractionist.Read more...
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Special Feature: Pharmaceutical Analysis (5): Analysis of trace impurities in pharmaceutical products using polarized EDXRF spectrometer NEX CG.Read more...
XRF, XRD and Raman for elemental and phase analysis
Commonly employed techniques to non-destructively determine the composition of an unknown sample are X-ray fluorescence (XRF) and X-ray diffraction (XRD). X-ray fluorescence provides elemental composition information for boron (B) through uranium (U) from parts-per-million (PPM) to percent (%) levels. Using fundamental parameters (FP) algorithms, XRF can provide quantitative analysis without the need for reference standards. X-ray diffraction provides phase composition identification and can distinguish the major, minor, and trace compounds present in a sample. XRD analysis includes the mineral name of the substance, chemical formula, crystalline system, and reference pattern number from the ICDD International database. Standardless quantitative information can also be obtained from XRD using Rietveld Analysis.
New 5th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Curved imaging plate (IP) XRD system features an extremely large aperture and a choice of rotating anode or sealed tube X-ray sources
Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders
High power, tube below, sequential WDXRF spectrometer with mapping and superior light element performance
|ZSX Primus II
High power, tube above, sequential WDXRF spectrometer with mapping and superior light element performance
|ZSX Primus IV
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U
XRR, XRF, and XRD metrology tool for patterned wafers; up to 300 mm wafers
Handheld Raman analyzer designed to be customizable and flexible for seamless integration into any work environment