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Rigaku nano3DX is a true X-ray microscope (XRM) with ultra-wide field of view, 25X larger volume than comparable systems, and three X-ray wavelengths for different matrices.Read more...
HyPix-3000 is a next-generation two-dimensional hybrid pixel array semiconductor detector designed specifically to meet the needs of the home lab diffractionist.Read more...
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X-ray diffraction (XRD) for determining orientation
Single crystals form the basis of a wide range of technological products. Electronic properties of single crystals are critical to the semiconductor industry while magnetic properties of single crystals are important to the performance of magnetic storage devices. Mechanical and chemical properties of single crystals underlie advances in materials science. In most cases, the properties of a single crystal are not only a function of the type and quality of the crystal, but strongly dependent on its orientation. Determination of orientation thus represents an essential step for using single crystals in technological applications. X-ray diffraction (XRD) has become the universal method for determining crystal orientation.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control