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Rigaku nano3DX is a true X-ray microscope (XRM) with ultra-wide field of view, 25X larger volume than comparable systems, and three X-ray wavelengths for different matrices.Read more...
HyPix-3000 is a next-generation two-dimensional hybrid pixel array semiconductor detector designed specifically to meet the needs of the home lab diffractionist.Read more...
Analytical solutions by industry
New papers of interest
Special Feature: Pharmaceutical Analysis (5): Analysis of trace impurities in pharmaceutical products using polarized EDXRF spectrometer NEX CG.Read more...
Quality control by XRF / XRD for elemental / phase analysis
The need for chemical analysis of food and cosmetics has increased in recent years. Increased emphasis in industry, and by government, on safety, efficacy and content labeling are the core drivers. Near line monitoring during the production process also affords long-term cost savings from decreased waste, rework and materials costs. The United States (FDA), European Union and various other regulatory bodies around the world strictly regulate the allowable concentrations of heavy metal contaminants in foodstuffs, drugs and cosmetics. In addition, much commercial food production requires careful monitoring of salt concentrations to ensure correct flavor characteristics. Cosmetics that use metal oxides for sunscreen protection factor (SPF) enhancement must have 100% quality inspection to meet U.S. over-the counter (OTC) pharmaceutical regulations. Packaging must also be monitored for contaminates that may leach into products.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders
New 5th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
High power, tube below, sequential WDXRF spectrometer with mapping and superior light element performance