Forensics

XRD and XRF for phase and elemental analysis / RAMAN for chemical identification

X-ray analytical methods have a long history as important tools used to investigate and establish facts in criminal or civil courts of law. Law enforcement at local, state, national, and international levels, as well as customs offices, routinely use X-ray tools to identify, compare or analyze unknown materials. Small spot X-ray fluorescence (XRF) is a non-destructive method that can not only identify and quantify a vast number of atomic elements but also generate area maps of elemental distribution. Common applications include mapping of Pb and Cu residue from bullet holes in clothing, glass chip analysis, ink content and residue analysis. X-ray diffraction (XRD) can identify chemical phases in complete unknowns. For both techniques, quantitative results can be obtained without the use of standards. Rigaku's new Raman spectrometer series are also perfect for chemical or organic materials identification, whether in the lab or in the field.

Systems: 
  NEX CG
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
    MiniFlex
New 5th-generation general purpose benchtop XRD system for phase i.d and phase quantification
    ZSX Primus
High power, tube below, sequential WDXRF spectrometer with mapping and superior light element performance
  Xantus
Portable RAMAN spectrometer for rapid chemical identification; uniquely available with 532, 785 and 1064 nm laser excitation.
    FirstGuard
Handheld RAMAN spectrometer for rapid chemical identification; uniquely available with 532, 785 and 1064 nm laser excitation
    Ultima IV
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control