Geology and minerals

XRD and XRF for phase and elemental analysis

In studying planetary processes and makeup of the Earth, geologists routinely analyze the composition and molecular structure of rock and mineral samples. Long having been central tools in geological research, X-ray analytical techniques have become more powerful with small spot excitation, mapping, and standardless quantitative analysis. X-ray fluorescence (XRF) is the key technique for characterizing the element composition of geological materials. The latest generation of wavelength dispersive XRF instrumentation employ a small analyzing area and a XY-stage to automatically make multiple measurements of a sample to produce a chemical composition map. X-ray diffraction (XRD) is employed to quantitatively measure phase composition. Rietveld analysis of X-ray diffraction data is now recognized as the most powerful method available for quantitative crystalline phase analysis. Rigaku technology and expertise provide a number of unique solutions for these determinations.

Systems: 
  NEX CG
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
    MiniFlex
New 5th-generation general purpose benchtop XRD system for phase i.d and phase quantification
    Supermini200
Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders
  ZSX Primus IV
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system softwarea
    Ultima IV
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
    FirstGuard
Handheld RAMAN spectrometer for rapid chemical identification; uniquely available with 532, 785 and 1064 nm laser excitation