Mining and refining

XRD and XRF for phase and elemental analysis

In studying planetary processes and makeup of the Earth, geologists routinely analyze the composition and molecular structure of rock and mineral samples. Long having been central tools in geological research, X-ray analytical techniques have become more powerful with small spot excitation, mapping, and standardless quantitative analysis. X-ray fluorescence (XRF) is the key technique for characterizing the element composition of geological materials. The latest generation of wavelength dispersive XRF instrumentation employ a small analyzing area and a XY-stage to automatically make multiple measurements of a sample to produce a chemical composition map. X-ray diffraction (XRD) is employed to quantitatively measure phase composition. Rietveld analysis of X-ray diffraction data is now recognized as the most powerful method available for quantitative crystalline phase analysis. Rigaku technology and expertise provide a number of unique solutions for these determinations.

Systems: 
  ZSX Primus
IV

High power, tube above, sequential WDXRF
spectrometer with new ZSX Guidance expert system software
    ZSX Primus II
High power, tube above, sequential WDXRF spectrometer with mapping and superior light element performance
    Supermini200
Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders
  Simultix 14
High throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U
 
  RAPID II
Curved imaging plate (IP) XRD system features an extremely large aperture and a choice of rotating anode or sealed tube X-ray sources
    Ultima IV
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
    MiniFlex
New 5th-generation general purpose benchtop XRD system for phase i.d and phase quantification