Polymers and plastics

XRD and XRF for phase and elemental analysis

For all tasks in polymer research, product development, and production quality control, X-ray fluorescence (XRF) analysis can identify and quantify the concentrations of additives (pigments, fillers, flame retardants, stabilizers) like antimony, barium, bromium, calcium, chromium (for the RoHS/WEEE regulations), copper, phosphorus, titanium or zinc.

In addition, many plastic polymers have some order and can be identified and studied by X-ray diffraction (XRD) methods. These polymers are, at least in part, crystalline or pseudo-crystalline with partially ordered structures which cause diffraction peaks. The percent crystallinity is often related to processing methods and is of great importance in polymer chemistry. Other uses of XRD in plastics and polymers research and production include: determination of unit cell type and lattice parameters, determination of the microstructure, and determination of crystallographic orientation through pole figures. 

Polymers can also be investigated by small angle X-ray scattering (SAXS). Either dissolved or as a solid, the SAXS technique can characterize polymers according to large scale internal structure. Rigaku technology and expertise are combined to provide a number of X-ray analytical products for these applications.

  ZSX Primus IV
High power, tube above, sequential WDXRF
spectrometer with new ZSX Guidance expert system software
    NEX QC
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
    NEX CG
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders
Small angle X-ray scattering
(SAXS) pin-hole camera system
New 5th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
    Ultima IV
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Curved imaging plate (IP) XRD system features an extremely large aperture and a choice of rotating anode or sealed tube X-ray sources
World's most powerful θ/θ high-resolution X-ray diffractometer features an in-plane diffraction arm