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Rigaku nano3DX is a true X-ray microscope (XRM) with ultra-wide field of view, 25X larger volume than comparable systems, and three X-ray wavelengths for different matrices.Read more...
HyPix-3000 is a next-generation two-dimensional hybrid pixel array semiconductor detector designed specifically to meet the needs of the home lab diffractionist.Read more...
Analytical solutions by industry
New papers of interest
Special Feature: Pharmaceutical Analysis (5): Analysis of trace impurities in pharmaceutical products using polarized EDXRF spectrometer NEX CG.Read more...
Elemental / phase analysis of production pipelines
At the core of production quality management is process control, a statistics and engineering discipline that deals with architectures, mechanisms, and algorithms for controlling the output of a specific process. Analytical information, such as elemental analysis, chemical composition, or molecular structure data, is commonly used to provide critical data to the statistical process control (SPC) model controlling the process. X-ray analytical techniques play an important role in many process control strategies.
X-ray diffraction (XRD) is often employed to determine percent crystallinity in a batch of polymer as well as providing polymorph validation in pharmaceutical production. X-ray fluorescence (XRF) is used to control many disparate production processes, from the stoichiometry of metal oxides in cement production, to critical additives in plastics and sulfur in fuels. Rigaku offers robust benchtop X-ray instruments that were specifically designed for the production environment.
With the new Rigaku NEX XT, an X-ray Transmission (XRT) process sulfur (S) gauge, refineries and pipelines can easily switch and blend crude oil feedstocks
|ZSX Primus IV
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Process sulfur analysis by X-ray transmission (X-ray absorption)
New 5th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Benchtop tube below sequential WDXRF spectrometer analyzes F through U in solids, liquids and powders
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Tube below, single element WDXRF analyzer for quality control applications
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films