Summer 2018, Volume 34, No. 2

Technical articles

  • Development of innovative organic semiconductors driven by state-of-art analytical instruments by Toshihiro Okamoto
  • Various pole figure measurement techniques with SmartLab, assisting thin film characterization by Katsuhiko Inaba and Shintaro Kobayashi
  • Real-time analysis and display function using SmartLab Studio II by Takahiro Kuzumaki and Aya Ogi
  • Introduction to single crystal X-ray analysis XIV. Model construction and refinement, and evaluation of results by Takashi Matsumoto
  • X-ray fluorescence analysis of zinc and zinc-iron alloy coated steel sheet by Takao Moriyama and Kenji Kodama
  • Evolved gas analysis by simultaneous thermogravimetric differential thermal analysis-Fourier transromations infrared spectroscopy (TG-DTA-FTIR) by Tadashi Arii

New Products

  • Automated multipurpose X-ray diffractometer SmartLab
  • Multi-channel X-ray fluorescence spectrometer Simultix 15
  • X-ray fluorescence spectrometer ZSX Primus400
  • Specialized, versatile, compact WDXRF spectrometer Supermini200 (RX9)
Download the articles from this issue
E-mail address:
Occasionally we would like to send you news, updates, and special promotions about our products and services. By checking the “I Agree” box and submitting your email address, you are giving us your express consent to send you these types of emails and you are also agreeing to Our Privacy Notice. (click Our Privacy Notice link to review it) and Our Terms & Conditions. (click Our Terms link to review it) I agree