Winter 2015, Volume 31, No. 1

  • The Nobel prize in physics 2014 by Katsuhiko Inaba
  • Applications of the two-dimensional detector HyPix-3000 in X-ray diffractometry by Atsushi Ohbuchi
  • A primer on the use of the nano3DX high-resolution X-ray microscope by Yoshihiro Takeda and Kensaku Hamada
  • Introduction to single crystal X-ray analysis VII. Refinement of disordered structure by Kimiko Hasegawa
  • Sample preparation for X-ray fluorescence analysis III. Pressed and loose powder methods by Gakuto Takahashi
  • Portable stress analyzer SmartSite RS
  • Structure analysis program package CrystalStructure™ 4.1
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