Rigaku Features Latest X-ray Analytical Instrumentation at 2018 Denver X-ray Conference

Rigaku is in attendance at the 67th Annual Conference on Applications of X-ray Analysis to showcase its XRD and XRF spectrometers

August 6, 2018 –Westminster, CO. Rigaku Corporation, a global leader in X-ray analytical instrumentation, is pleased to announce its attendance at the 67th annual Denver X-ray Conference (DXC 2018), being held at the Westin Westminster Hotel, Westminster, Colorado, the week of August 6 -10, 2018. Rigaku is exhibiting its diverse range of X-ray diffraction (XRD) and X-ray fluorescence (XRF) instrumentation in the South Foyer at Booth numbers 41, 42, and 43. X-ray and EUV multilayer optics from Rigaku Innovative Technologies (RIT) are featured at booth 44.

Rigaku manufactures a complete range of XRD and XRF instruments and components for research, testing, industrial process control, and product development. Featured systems include the new sixth generation Rigaku MiniFlex benchtop X-ray diffraction instrument. The MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials.
The Rigaku SmartLab intelligent X-ray diffraction system is a multi-purpose, high-resolution diffractometer. The SmartLab ® system is designed for all XRD applications, from powder and thin film diffraction to small angle X-ray scattering (SAXS) and in-plane scattering. The system’s Guidance software provides an intelligent interface that guides users through each experiment.

Also featured is the Rigaku Supermini200 wavelength dispersive X-ray fluorescence (WDXRF) spectrometer. With enhanced software capabilities and an improved footprint, it is the only commercially available benchtop WDXRF spectrometer.

Energy dispersive X-ray fluorescence (EDXRF) spectrometers from Rigaku include the Rigaku NEX CG Cartesian-geometry EDXRF spectrometer, a powerful analyzer designed to deliver rapid qualitative and quantitative determination of major and minor atomic elements across a wide variety of sample types.
Workshops will take place throughout the conference and will include presentations from Rigaku covering topics such as Quantitative Analysis, Trace Analysis, and Two-dimensional Detectors.

A Monday evening XRD Poster Session will be held from 5:00 pm – 7:00 pm and will feature:

• New Stage of Benchtop X-ray Diffractometer MiniFlex with New Two-dimensional Detector and Temperature-Control Attachment
• Evaluation of Physicochemical Properties of 137Cs in Geological Materials by X-ray Diffractometry

Tuesday evening’s XRD poster session will feature:

• Trace Element Analysis of Waste Water and Eluate Samples by Total Reflection X-ray Fluorescence Spectrometry