Small angle X-ray scattering (SAXS) products

Small angle X-ray scattering (SAXS) Kratky camera system
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
Small angle X-ray scattering (SAXS) pin-hole camera system
  Ultima IV
High-performance, multi-purpose XRD system with SAXS capability
Advanced state-of-the-art high-resolution XRD / SAXS system powered by Guidance expert system software

Small-angle X-ray scattering (SAXS) is a small-angle scattering (SAS) technique where the elastic scattering of X-rays by a sample which has inhomogeneities in the nanometer range, is recorded at very low angles (typically 0.1 - 10°). This angular range contains information about the shape and size of macromolecules, characteristic distances of partially ordered materials, pore sizes, and other data. SAXS is capable of delivering structural information of macromolecules between 5 and 25 nm, of repeat distances in partially ordered systems of up to 150 nm.*

*Glatter O, Kratky O, ed (1982). Small Angle X-ray Scattering. Academic Press. ISBN 0-12-286280-5.