Features of the MiniFlex300

Fig. 1 shows the appearance of the MiniFlex300 main unit. The main unit dimensions are 560(W) x 530(D) x 700(H) mm. The water cooling system is integrated into the rear of the unit, so the diffractometer can be setup and used virtually anywhere, as shown in Fig. 2.

Fig. 1: Photo showing appearance of MiniFlex300 Fig. 2: MiniFlex300 exhibited at JASIS 2012 (Makuhari Messe) (measurement in progress)

Fig. 3: Qualitative analysis results for a mineral sample

Apparatus condition:

MiniFlex300 (F.F tube 30 kV, 10 mA), Detector: Scintillation counter (Kβ filter), Slit conditions: DS / SS = 1.25°, RS = 0.3 mm, Incident side and receiving side Soller slit: 5°, Incident height limiting slit = 10 mm

Measurement condition:

Scan range: 2θ = 10 ~ 90°, Step width: 0.02°, Scan speed: 4° / min. (about 20 min.)

New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Read more...

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