Suppression of the umbrella effect due to differences in Soller slits

With the MiniFlex300/600, it is possible to select Soller slits with small widths in order to obtain high resolution. In particular, the 0.5° receiving Soller slit and the 5 mm or 2 mm incident high limiting (DHL) slits can suppress the axial divergence, or umbrella effect which is prominent on the low-angle side. Fig. 1 shows a comparison of the X-ray diffraction profiles of zeolite-A when the receiving Soller slit and DHL are changed (the incident Soller slit is 2.5°). Intensity is normalized, and the actual intensity ratios are as shown in Table 1.

app byte image
  app byte image
Table 1: Intensity ratios and full width at half maximum due to differences in Soller slits Fig. 1: Comparison of profile ratios when using
Soller slits with different widths (Intensity is normalized)

Using the D/teX Ultra high-speed 1-dimensional detector is effective not only for rapid measurement, but also for detecting trace components. Fig. 2 shows the X-ray diffraction pattern and qualitative analysis results for a mineral sample, obtained in a measurement time of 1 minute. This enables qualitative analysis, with good sensitivity, and evaluation in an extremely short measurement time of mixed mineral samples with multiple components. 

app byte image
Fig. 2: X-ray diffraction patterns obtained from mesoporous silica
and relative face spacing values when d₁ is set to 1

Apparatus and measurement condition:

MiniFlex600 (F.F tube 40 kV, 15 mA), Detector: D/teX Ultra, Scan range: 2θ = 10 ~ 90°, Step width: 0.02°

MiniFlexNew sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Read more about Rigaku's MiniFlex...

Ask for more info