Suppression of the umbrella effect due to differences in Soller slits

With the MiniFlex300/600, it is possible to select Soller slits with small widths in order to obtain high resolution. In particular, the 0.5° receiving Soller slit and the 5 mm or 2 mm incident high limiting (DHL) slits can suppress the axial divergence, or umbrella effect which is prominent on the low-angle side. Fig. 1 shows a comparison of the X-ray diffraction profiles of zeolite-A when the receiving Soller slit and DHL are changed (the incident Soller slit is 2.5°). Intensity is normalized, and the actual intensity ratios are as shown in Table 1.

Table 1: Intensity ratios and full width at half maximum due to differences in Soller slits Fig. 1: Comparison of profile ratios when using
Soller slits with different widths (Intensity is normalized)

Using the D/teX Ultra high-speed 1-dimensional detector is effective not only for rapid measurement, but also for detecting trace components. Fig. 2 shows the X-ray diffraction pattern and qualitative analysis results for a mineral sample, obtained in a measurement time of 1 minute. This enables qualitative analysis, with good sensitivity, and evaluation in an extremely short measurement time of mixed mineral samples with multiple components. 

Fig. 2: X-ray diffraction patterns obtained from mesoporous silica
and relative face spacing values when d₁ is set to 1

Apparatus and measurement condition:

MiniFlex600 (F.F tube 40 kV, 15 mA), Detector: D/teX Ultra, Scan range: 2θ = 10 ~ 90°, Step width: 0.02°

The fifth generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. The MiniFlex is available in two variations. Operating at 600 watts (X-ray tube), the MiniFlex 600 is twice as powerful as other benchtop models, enabling faster analysis and improved overall throughput. Running at 300 watts (X-ray tube), the new MiniFlex 300 does not require an external heat exchanger. Each model is engineered to maximize flexibility in a benchtop package. Read more...

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