Measurement in a short time using the D/teX Ultra

The MiniFlex300/600 can be equipped with the D/teX Ultra high-speed 1-dimensional detector to obtain greater intensity. By using this detector, it is possible to obtain intensity a few tens to roughly 100 times greater than with a scintillation counter, and this enables a dramatic shortening of measurement time. Fig. 1 shows the diffraction profiles obtained with a scintillation counter and the D/teX Ultra high-speed 1-dimensional detector. The D/teX Ultra detector measures data faster because it can measure a wide range of 2θ simultaneously with good angular resolution.

Fig. 1: Diffraction profiles when using a scintillation
counter and high-speed 1-dimensional detector

Using the D/teX Ultra high-speed 1-dimensional detector is effective not only for rapid measurement, but also for detecting trace components. Fig. 2 shows the X-ray diffraction pattern and qualitative analysis results for a mineral sample, obtained in a measurement time of 1 minute. This enables qualitative analysis, with good sensitivity, and evaluation in an extremely short measurement time of mixed mineral samples with multiple components. 

Fig. 2: Qualitative analysis of mineral sample

Apparatus condition:

MiniFlex600 (F.F tube 40 kV, 15 mA), Detector: D/teX Ultra, Slit conditions: DS = 1.25°, SS = 8 mm, RS = 13mm, Incident side and receiving side Soller slit: 5°, Incident height limiting slit = 10 mm

Measurement condition:

Scan range: 2θ = 10 ~ 70°, Step width: 0.02°, Scan speed: 80° / min. (about 1 min.)

New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago. Read more...

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